SYSTEM SERIES: LumiSolar Cell
SYSTEM SERIES: LumiSolar Cell
Camera Familes
Camera Series
System
Applications
System Applications
Inspection of wafer, solar cells, and modules
Solar cells and solar modules suffer from a variety of invisible defects which reduce their output power and long-term stability. The highly sensitive Inspection Systems from greateyes can image these problems. This allows you to optimize the production, increase output power, and reduce overall costs.
Get in touch with our experts to find the most qualified greateyes system for your application.
Advantages of Electroluminescnece (EL) and Photoluminescence (PL) inspection
- EL and PL are non-destructive methods
- Measurements deliver detailed information about detfects and their location
- EL and PL provide a high informative content and many types of defects can be clearly identified
- Fast measurement on a second timescale
- EL can be used to investigate small cells as well as large areas made from mono-Si, poly-Si, a-Si, mirco-Si, CIGS, CIS, CdTe
- Method can be integrated in the production process (in-line)
- EL and PL are also well suited for research and development of new photovoltaic devices
Differences between EL and PL inspection
Electroluminescence (EL)
Photoluminescence (PL)
Requirements
Electrical contacts are neccessary
No electrical contacts needed
Substrates
Solar cells, strings, modules
Wafers, solar cells, as-cut wafers
Materials
mono-Si, poly-Si, a-Si, HJT, Perovskite, Tandem technology, CIGS, CIS, CdTe, OPV
mono-Si, poly-Si, a-Si, HJT, Perovskite, Tandem technology, CIGS, CIS, CdTe, OPV
Measurement time
0.2 - 1 second for mono-Si or poly-Si
0.2 - 2 seconds for mono-Si or poly-Si
Informative value
Micro-cracks, shunts, finger defects, deposition problems, bad edge isolation
Micro-cracks, inhomogenities, impurities, dislocations
References
- Standard Thermal Cycling Test
S. Roy, S. Kumar, R. Gupta. Investigation and analysis of finger breakages in commercial crystalline silicon photovoltaic modules under standard thermal cycling test. Engineering Failure Analysis, 2019, Volume 101, Pages 309-319
- PV Field Applications
U. Jahn et al. Review on IR and EL Imaging for PV Field Applications. International Energy Agency, Photovoltaic Power Systems Programme, Report IEA-PVPS T13-10:2018, March 2018
- Crystalline Silicon As-Cut Wafers
M. Regehly, R. Kemmler. LED-Based Photoluminescence Inspection of Crystalline Silicone As-Cut Wafers. Poster at the EU PVSEC 2015, Hamburg
- Degradation
C. Peike, S. Hoffmann, M. Heck, T. Kaltenbach, K.-A. Weiß, M. Köhl. Nondestructive Determination of Climate-Specific Degradation Patterns for Photovoltaic-Module Encapsulation. Energy Technology, 2014, Volume 2, Issue 1, pages 121–129C. Peike, S. Hoffmann, P. Hülsmann, B. Thaidigsmann, K.A. Weiβ, M. Koehl, P. Bentz. Origin of damp-heat induced cell degradation. Solar Energy Materials and Solar Cells, 2013, Volume 116, Pages 49–54
- Defect Detection
A. Mansouri, M. Zettl, O. Mayer, M. Lynass, M. Bucher, O. Stern, C. Heller, E. Mueggenburg. Defect detection in photovoltaic modules using electroluminescence imaging. 27th EU PVSEC, 2012M. Regehly, J. Penlington. Im Einsatz für mehr Strom. Elektrolumineszenz-Inspektion von Solarzellen und -modulen, Inspect-Online, 3/2012
