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LEED Imaging

Low Energy Electron Diffraction technique

LEED (Low Energy Electron Diffraction) imaging is a technique used to determine the atom formation on surface structures and thin films of crystalline materials. For this purpose, a bombardment with a collimated beam of low energy electrons on the probe material is arranged. The electrons are scattered on the surface and are observable as spots on a fluorescent screen. The example below shows a sample material that was bombarded with electrons. The resulting diffraction pattern has been recoded by the camera GE 1024 1024 BI MID. The high sensitivity of this camera allows to detect weak diffraction spots.

LEED imaging (1)

References

  • I. Mantouvalou, K. Witte, W. Martyanov, A. Jonas, D. Grötzsch, C. Streeck, H. Löchel, I. Rudolph, A. Erko, H. Stiel and B. Kanngießer, Single shot near edge x-ray absorption fine structure spectroscopy in the laboratory, Appl. Phys. Lett. 108, 201106 (2016)
  • P. Wachulak, M. Duda, A. Bartnik, A. Sarzyński, Ł. Węgrzyński, M. Nowak, A. Jancarek and H. Fiedorowicz, Compact system for near edge X-ray fine structure (NEXAFS) spectroscopy using a laser-plasma light source, Opt. Express 26, 8260-8274 (2018)

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